EDGE CHROVIT

It is possible to simultaneously capture images of the top surface and one side surface of a workpiece from a single direction.
This is often used for inspecting the top and side surfaces of continuous workpieces, such as coiled materials, as well as for inspecting the inner surfaces of connectors. Additionally, it is widely used for simple applications such as capturing images inside holes or for light guiding. It can similarly be used for laser marking.
For most models, the laser beam path is radiated radially. By placing CHROVIT on the optical axis, you can eliminate the need for time-consuming adjustments to tilt the collimator.

It is possible to simultaneously capture three images: the front view (straight-through imaging) and the images of two side surfaces of the workpiece.
This is often used for inspecting coplanarity of IC leads.
This approach is commonly used when inspecting three surfaces of a workpiece simultaneously in a single stage along the transport path of workpieces aligned by a parts feeder or similar device.
This is also used when adding inspection surfaces without increasing the number of inspection stages.

It is possible to simultaneously capture images of the four sides of the workpiece and the front view.
Since this method requires the workpiece to be inserted into CHROVIT, the common approach is to pick up the workpiece with a suction pad and place it inside the CHROVIT.
It is primarily used for inspecting chip components and similar parts.
However, if the CHROVIT is very small, cleaning the internal square hole is difficult, making it less suitable for the inspection of minute workpieces.